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  • Source Spectral Analysis:  Spectral output of radiating sources, 200 nm - 30 µm
  • NVG Measurements
    • OL Series 750-NVG Automated Spectroradiometric Measurement System is configured specifically for certification of NVIS-compatible lighting per the requirements of MIL-L-85762A
    • OL 770-NVS Night Vision Compatible Lighting Display Test and Measurement System addresses the needs of the aerospace lighting industry for quantifying cockpit display NVIS compatibility and aircraft exterior lighting
    • OL Series 750 Automated Spectroradiometric Measurement System can be configured for NVIS filter measurements
  • Detector Spectral Response:  Measurement of the spectral sensitivity of various detectors and radiometers
  • Total Spectral Flux Measurements:  Measurement of the radiometric and photometric output of a lamp in all directions
  • Diffuse Spectral Reflectance:  Total hemispherical reflectance of materials that scatter as they reflect
  • Specular Spectral Reflectance:  Measurement of the specular reflectance of polished material or mirrors as a function of both wavelength and angle of incident radiation
  • Spectral Transmittance:  Measurement of regular (linear) and diffuse (scattered) transmittance of a material
  • LED Spectral Analysis:  Quantifying photometric and radiometric properties of LEDs (200 - 1100 nm)
  • Display Measurement:  A complete solution for modern display measurement requirements
 
 
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4632 36th Street Orlando, FL  32811              
Phone: 407-422-3171 Toll Free: 800-899-3171

 

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